Enhanced Environmental Scanning Electron Microscopy Using Phase Reconstruction and Its Application in Condensation-Reference-Cited by-同舟云学术

Enhanced Environmental Scanning Electron Microscopy Using Phase Reconstruction and Its Application in Condensation

Author:

Zhang Lenan¹^ORCID,Zhu Jinlong²,Wilke Kyle L.¹^ORCID,Xu Zhenyuan³^ORCID,Zhao Lin¹,Lu Zhengmao¹^ORCID,Goddard Lynford L.²,Wang Evelyn N.¹^ORCID

Affiliation:

1. Department of Mechanical Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, United States

2. Department of Electrical and Computer Engineering, University of Illinois at Urbana−Champaign, Urbana, Illinois 61801, United States

3. Institute of Refrigeration and Cryogenics, Shanghai Jiao Tong University, Shanghai 200240, China

Funder

Cisco Systems

Singapore-MIT Alliance for Research and Technology Centre

College of Engineering, University of Illinois at Urbana-Champaign

Microsystems Technology Laboratories, Massachusetts Institute of Technology

Zhejiang University/University of Illinois at Urbana-Champaign Institute

Publisher

American Chemical Society (ACS)

Subject

General Physics and Astronomy,General Engineering,General Materials Science

Link

Reference46 articles.

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