Fast Neutron Imaging with Semiconductor Nanocrystal Scintillators-Reference-Cited by-同舟云学术

Fast Neutron Imaging with Semiconductor Nanocrystal Scintillators

Published:2020-09-08 Issue:11 Volume:14 Page:14686-14697
ISSN:1936-0851
Container-title:ACS Nano
language:en
Short-container-title:ACS Nano

Author:

McCall Kyle M.¹²^ORCID,Sakhatskyi Kostiantyn¹²^ORCID,Lehmann Eberhard³^ORCID,Walfort Bernhard⁴,Losko Adrian S.⁵^ORCID,Montanarella Federico¹²^ORCID,Bodnarchuk Maryna I.¹²^ORCID,Krieg Franziska¹²^ORCID,Kelestemur Yusuf¹²⁶^ORCID,Mannes David³^ORCID,Shynkarenko Yevhen¹²^ORCID,Yakunin Sergii¹²^ORCID,Kovalenko Maksym V.¹²^ORCID

Affiliation:

1. Laboratory of Inorganic Chemistry, Department of Chemistry and Applied Biosciences, ETH Zürich, Vladimir Prelog Weg 1, Zürich, CH-8093, Switzerland

2. Laboratory for Thin Films and Photovoltaics, Empa—Swiss Federal Laboratories for Materials Science and Technology, Überlandstrasse 129, Dübendorf, CH-8600, Switzerland

3. Paul Scherrer Institut, Villigen PSI, 5232, Switzerland

4. RC Tritec Ltd., Teufen, 9053, Switzerland

5. Forschungs-Neutronenquelle Heinz Maier-Leibnitz, Garching, 85748, Germany

6. Department of Metallurgical and Materials Engineering, Atilim University, Ankara, 06830, Turkey

Funder

Eidgen?ssische Technische Hochschule Z?rich

RC Tritec AG

Publisher

American Chemical Society (ACS)

Subject

General Physics and Astronomy,General Engineering,General Materials Science

Link

http://pubs.acs.org/doi/pdf/10.1021/acsnano.0c06381

Reference64 articles.

1. Inorganic scintillators in medical imaging

2. Neutron imaging—detector options and practical results

3. Advances in neutron imaging

4. X-Ray Imaging

5. Berger, M.; Hubbell, J.; Seltzer, S.; Chang, J.; Coursey, J.; Sukumar, R.; Zucker, D.; Olsen, K. Xcom: Photon Cross Sections Database, NIST Standard Reference Database 8 (XGAM). NIST, 2010.

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