Real-Time TEM Observation of the Role of Defects on Nickel Silicide Propagation in Silicon Nanowires-Reference-Cited by-同舟云学术

Real-Time TEM Observation of the Role of Defects on Nickel Silicide Propagation in Silicon Nanowires

Published:2024-03-21 Issue:14 Volume:18 Page:10270-10278
ISSN:1936-0851
Container-title:ACS Nano
language:en
Short-container-title:ACS Nano

Author:

Adegoke Temilade Esther¹^ORCID,Bekarevich Raman²^ORCID,Geaney Hugh¹^ORCID,Belochapkine Sergey³,Bangert Ursel⁴,Ryan Kevin M.¹^ORCID

Affiliation:

1. Department of Chemical Sciences and Bernal Institute, University of Limerick, Limerick, V94 T9PX Ireland

2. Advanced Microscopy Laboratory, Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN), Trinity College Dublin, Dublin, D02 DA31 Ireland

3. Bernal Institute, University of Limerick, Limerick, V94 T9PX Ireland

4. Department of Physics and Bernal Institute, University of Limerick, Limerick, V94 T9PX Ireland

Funder

Science Foundation Ireland

Publisher

American Chemical Society (ACS)

Link

https://pubs.acs.org/doi/pdf/10.1021/acsnano.4c01060

Reference49 articles.

1. High-performance thin-film transistors using semiconductor nanowires and nanoribbons

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3. Strong broadband optical absorption in silicon nanowire films

4. Electrical detection of single viruses

5. High-performance lithium battery anodes using silicon nanowires

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