AC Kelvin Probe Force Microscopy Enables Charge Mapping in Water
Author:
Affiliation:
1. Automation and Control Institute (ACIN), TU Wien, Gusshausstrasse 27-29, A-1040Vienna, Austria
2. Department of Physics, King’s College London, Strand, LondonWC2R 2LS, United Kingdom
Funder
Austrian Science Fund
Publisher
American Chemical Society (ACS)
Subject
General Physics and Astronomy,General Engineering,General Materials Science
Link
https://pubs.acs.org/doi/pdf/10.1021/acsnano.2c07121
Reference36 articles.
1. Kelvin probe force microscopy
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4. AFM-assisted fabrication of thiol SAM pattern with alternating quantified surface potential
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