Probing Inherent Optical Anisotropy in Substrates via Direct Nanoimaging of Mie Scattering

Author:

Woo Hwi Je1,Han Jaewon1,Ji Sangmin1,Shin Bong Gyu12,Park Seong Hun3,Lee Sung-Gyu45,Lee Chang-Won6,Hwang Euyheon127,Kim Deok-Soo8,Choi Soobong910ORCID,Jeong Mun Seok11ORCID,Yi Gi-Ra3ORCID,Kim Junki127,Song Young Jae127ORCID

Affiliation:

1. SKKU Advanced Institute of Nanotechnology (SAINT), Sungkyunkwan University, Suwon 16419, Republic of Korea

2. Department of Nano Science and Technology, Sungkyunkwan University, Suwon 16419, Republic of Korea

3. Department of Chemical Engineering, Pohang University of Science and Technology (POSTECH), Pohang, Gyeongbuk 37673, Republic of Korea

4. Center for Integrated Nanostructure Physics, Institute for Basic Science (IBS), Suwon 16419, Republic of Korea

5. Department of Energy Science, Sungkyunkwan University, Suwon 16419, Republic of Korea

6. Institute of Advanced Optics and Photonics, Department of Applied Optics, School of Basic Sciences, Hanbat National University, Daejeon 34158, Republic of Korea

7. Department of Nano Engineering, Sungkyunkwan University, Suwon 16419, Republic of Korea

8. Advanced Facility Center for Quantum Technology, Sungkyunkwan University, Suwon 16419, Republic of Korea

9. Department of Physics, Incheon National University, Incheon 22012, Republic of Korea

10. Intelligent Sensor Convergence Research Center (ISCRC), Incheon National University, Incheon 22012, Republic of Korea

11. Department of Physics, Hanyang University (HYU), Seoul 04763, Republic of Korea

Funder

National Research Foundation of Korea

Publisher

American Chemical Society (ACS)

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