Study of Film Growth Properties of Self-Assembled Polyelectrolyte Films of Higher Thickness: Reflectometric and Focused Ion Beam Analyses-Reference-Cited by-同舟云学术

Study of Film Growth Properties of Self-Assembled Polyelectrolyte Films of Higher Thickness: Reflectometric and Focused Ion Beam Analyses

Published:2008-06-21 Issue:28 Volume:112 Page:10531-10537
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Dejeu J.¹,Membrey F.¹,Diziain S.¹,Bainier C.¹,Spajer M.¹,Charraut D.¹,Foissy A.¹

Affiliation:

1. Institut UTINAM, UMR 6213 CNRS-UFC - Équipe Matériaux et Surfaces Structurés, and Institut FEMTO-ST, UMR 6174 CNRS-UFC-UTBM-ENSMM, Département d’Optique, Université de Franche-Comte, UFR Sciences et Techniques, 16 route de Gray - 25030 Besançon Cedex - France

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/jp802457x

Reference37 articles.

1. THIN FILM NANOFABRICATION BY ALTERNATE ADSORPTION OF POLYIONS, NANOPARTICLES, AND PROTEINS

2. Molecular self-assembly of conducting polymers

3. Solid-State Light-Emitting Devices Based on the Tris-Chelated Ruthenium(II) Complex: 3. High Efficiency Devices via a Layer-by-Layer Molecular-Level Blending Approach

4. Study of transport phenomena of FITC labeled dextran through nano self assembled microshells

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