Enhancing the Signal-to-Noise Ratio of X-ray Diffraction Profiles by Smoothed Principal Component Analysis
Author:
Affiliation:
1. Bede Scientific Instruments Ltd., Belmont Business Park, Durham, DH1 1TW, U.K.
Publisher
American Chemical Society (ACS)
Subject
Analytical Chemistry
Link
https://pubs.acs.org/doi/pdf/10.1021/ac050616c
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1. The use of synchrotron energy-dispersive diffraction for studying chemical reactions
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