Quantitative X-ray Photoelectron Spectroscopy and Time-of-Flight Secondary Ion Mass Spectrometry Characterization of the Components in DNA-Reference-Cited by-同舟云学术

Quantitative X-ray Photoelectron Spectroscopy and Time-of-Flight Secondary Ion Mass Spectrometry Characterization of the Components in DNA

Published:2004-01-15 Issue:4 Volume:76 Page:1114-1122
ISSN:0003-2700
Container-title:Analytical Chemistry
language:en
Short-container-title:Anal. Chem.

Author:

May Collin J.¹,Canavan Heather E.¹,Castner David G.¹

Affiliation:

1. National ESCA and Surface Analysis Center for Biomedical Problems, Departments of Bioengineering and Chemical Engineering, University of Washington, Box 351750, Seattle, Washington 98195-1750

Publisher

American Chemical Society (ACS)

Subject

Analytical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/ac034874q

Reference54 articles.

1. Microarray analysis: a novel research tool for cardiovascular scientists and physicians

2. Microarray analysis reveals a major direct role of DNA copy number alteration in the transcriptional program of human breast tumors

3. Fulfilling the promise: drug discovery in the post-genomic era

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