Effect of Interfacial Roughness Spin Scattering on the Spin Current Transport in YIG/NiO/Pt Heterostructures-Reference-Cited by-同舟云学术

Effect of Interfacial Roughness Spin Scattering on the Spin Current Transport in YIG/NiO/Pt Heterostructures

Published:2019-09-04 Issue:38 Volume:11 Page:35458-35467
ISSN:1944-8244
Container-title:ACS Applied Materials & Interfaces
language:en
Short-container-title:ACS Appl. Mater. Interfaces

Author:

Jin Lichuan¹^ORCID,Jia Kancheng¹,Zhang Dainan¹,Liu Bo²,Meng Hao²,Tang Xiaoli¹,Zhong Zhiyong¹,Zhang Huaiwu¹

Affiliation:

1. State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, 610054, China

2. Zhejiang Hikstor Technology Co., Ltd., Hangzhou, 310000, China

Funder

Ministry of Science and Technology of the People's Republic of China

National Natural Science Foundation of China

Sichuan Science and Technology Support Project

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acsami.9b12125

Reference41 articles.

1. Current-induced switching in a magnetic insulator

2. Measurement of the spin-transfer-torque vector in magnetic tunnel junctions

3. Observation of the Spin Hall Effect in Semiconductors

4. Giant Spin Pumping and Inverse Spin Hall Effect in the Presence of Surface and Bulk Spin−Orbit Coupling of Topological Insulator Bi2Se3

5. Observation of the spin-Seebeck effect in a ferromagnetic semiconductor

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