Transmission Electron Microscopy and Electron Energy-Loss Spectroscopy Studies of Hole-Selective Molybdenum Oxide Contacts in Silicon Solar Cells-Reference-Cited by-同舟云学术

Transmission Electron Microscopy and Electron Energy-Loss Spectroscopy Studies of Hole-Selective Molybdenum Oxide Contacts in Silicon Solar Cells

Published:2019-10-31 Issue:46 Volume:11 Page:43075-43080
ISSN:1944-8244
Container-title:ACS Applied Materials & Interfaces
language:en
Short-container-title:ACS Appl. Mater. Interfaces

Author:

Ali Haider¹,Maynau Céline,Lajaunie Luc^ORCID,Gregory Geoffrey,Wu Lijun,Looney John Patrick,Zhu Yimei^ORCID,Schneider Matthew²,Schoenfeld Winston V.¹,Davis Kristopher O.¹^ORCID

Affiliation:

1. Florida Solar Energy Center, University of Central Florida, Cocoa, Florida 32922, United States

2. Los Alamos National Laboratory, Los Alamos, New Mexico 87545, United States

Funder

Basic Energy Sciences

Solar Energy Technologies Program

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acsami.9b12703

Reference31 articles.

1. Dielectric surface passivation for silicon solar cells: A review

2. High-Performance TiO2-Based Electron-Selective Contacts for Crystalline Silicon Solar Cells

3. Silicon heterojunction solar cell with passivated hole selective MoOx contact

4. Hole Selective MoOx Contact for Silicon Solar Cells

5. Molybdenum and tungsten oxide: High work function wide band gap contact materials for hole selective contacts of silicon solar cells

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