Quantifying Intrinsic, Extrinsic, Dielectric, and Secondary Pyroelectric Responses in PbZr1–xTixO3 Thin Films-Reference-Cited by-同舟云学术

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Quantifying Intrinsic, Extrinsic, Dielectric, and Secondary Pyroelectric Responses in PbZr1–xTixO3 Thin Films

Published:2019-09-04 Issue:38 Volume:11 Page:35146-35154
ISSN:1944-8244
Container-title:ACS Applied Materials & Interfaces
language:en
Short-container-title:ACS Appl. Mater. Interfaces

Author:

Velarde Gabriel¹^ORCID,Pandya Shishir¹,Zhang Lei¹^ORCID,Garcia David¹,Lupi Eduardo¹,Gao Ran¹,Wilbur Joshua D.²,Dames Chris²,Martin Lane W.¹³^ORCID

Affiliation:

1. Department of Materials Science and Engineering, University of California, Berkeley, Berkeley, California 94720, United States

2. Department of Mechanical Engineering, University of California, Berkeley, Berkeley, California 94720, United States

3. Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, United States

Funder

Army Research Office

U.S. Department of Energy

National Science Foundation

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acsami.9b12191

Reference46 articles.

1. How to measure the pyroelectric coefficient?

2. Pyroelectric devices and materials

3. Applications of the pyroelectric effect

4. Giant Electrocaloric Effect in Thin-Film PbZr 0.95 Ti 0.05 O 3

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