Real-Space Mapping of Surface-Oxygen Defect States in Photovoltaic Materials Using Low-Voltage Scanning Ultrafast Electron Microscopy-Reference-Cited by-同舟云学术

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Real-Space Mapping of Surface-Oxygen Defect States in Photovoltaic Materials Using Low-Voltage Scanning Ultrafast Electron Microscopy

Published:2020-01-17 Issue:6 Volume:12 Page:7760-7767
ISSN:1944-8244
Container-title:ACS Applied Materials & Interfaces
language:en
Short-container-title:ACS Appl. Mater. Interfaces

Author:

Shaheen Basamat S.¹,El-Zohry Ahmed M.¹^ORCID,Zhao Jianfeng¹,Yin Jun¹^ORCID,Hedhili Mohamed N.²,Bakr Osman M.¹^ORCID,Mohammed Omar F.¹^ORCID

Affiliation:

1. Division of Physical Science and Engineering, King Abdullah University of Science and Technology, Thuwal 23955-6900, Kingdom of Saudi Arabia

2. Core Labs, King Abdullah University of Science and Technology, Thuwal 23955-6900, Kingdom of Saudi Arabia

Funder

King Abdullah University of Science and Technology

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acsami.9b20215

Reference61 articles.

1. Materials interface engineering for solution-processed photovoltaics

2. Organic solar cells based on non-fullerene acceptors

3. Air-Stable All-Inorganic Nanocrystal Solar Cells Processed from Solution

4. Plasmonic Solar Cells: From Rational Design to Mechanism Overview

5. Single-Crystal MAPbI3 Perovskite Solar Cells Exceeding 21% Power Conversion Efficiency

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