In-Depth Investigation of the Correlation between Organic Semiconductor Orientation and Energy-Level Alignment Using In Situ Photoelectron Spectroscopy-Reference-Cited by-同舟云学术

In-Depth Investigation of the Correlation between Organic Semiconductor Orientation and Energy-Level Alignment Using In Situ Photoelectron Spectroscopy

Published:2020-09-28 Issue:45 Volume:12 Page:50628-50637
ISSN:1944-8244
Container-title:ACS Applied Materials & Interfaces
language:en
Short-container-title:ACS Appl. Mater. Interfaces

Author:

Yun Dong-Jin¹^ORCID,Yun Youngjun²,Lee Jiyoul³^ORCID,Kim Joo-Young²^ORCID,Chung JaeGwan¹,Kim Seong Heon¹,Kim Yong-Su¹,Heo Sung¹,Park Jeong-Il²^ORCID,Kim Ki-Hong¹,Kwon Young-Nam¹,Chung Jong Won²^ORCID

Affiliation:

1. Analytical Engineering Laboratory, Samsung Advanced Institute of Technology, Samsung Electronics Co., Ltd., Suwon 16678, Korea

2. Organic Material Laboratory, Samsung Advanced Institute of Technology, Samsung Electronics Co., Ltd., Suwon 16678, Korea

3. Department of Graphic Arts Information Engineering, Pukyong National University, Busan 48513, Korea

Funder

Samsung

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acsami.0c09602