Large Increase in the Dielectric Constant and Partial Loss of Coherence Increases Tunneling Rates across Molecular Wires-Reference-Cited by-同舟云学术

Large Increase in the Dielectric Constant and Partial Loss of Coherence Increases Tunneling Rates across Molecular Wires

Author:

Chen Xiaoping¹,Salim Teddy²,Zhang Ziyu¹,Yu Xiaojiang³,Volkova Ira¹,Nijhuis Christian A.¹⁴^ORCID

Affiliation:

1. Department of Chemistry, National University of Singapore, 3 Science Drive 3, Singapore 117543, Singapore

2. School of Materials Science and Engineering, Nanyang Technological University, 50 Nanyang Avenue, Singapore 639798, Singapore

3. Singapore Synchrotron Light Source, National University of Singapore, 5 Research Link, Singapore 117603, Singapore

4. Centre for Advanced 2D Materials and Graphene Research Centre, National University of Singapore, 6 Science Drive 2, Singapore 117546, Singapore

Funder

Ministry of Education - Singapore

Prime Minister's Office Singapore

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

Link

Reference73 articles.

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