Nanoscale Pattern Decay Monitored Line by Line via In Situ Heated Atomic Force Microscopy-Reference-Cited by-同舟云学术

Nanoscale Pattern Decay Monitored Line by Line via In Situ Heated Atomic Force Microscopy

Published:2020-03-12 Issue:13 Volume:12 Page:15943-15950
ISSN:1944-8244
Container-title:ACS Applied Materials & Interfaces
language:en
Short-container-title:ACS Appl. Mater. Interfaces

Author:

Bhadauriya Sonal¹,Zhang Jianan²^ORCID,Lee Jaejun²,Bockstaller Michael R.²^ORCID,Karim Alamgir¹³^ORCID,Sheridan Richard J.⁴^ORCID,Stafford Christopher M.⁴^ORCID

Affiliation:

1. Department of Polymer Engineering, University of Akron, Akron, Ohio 44325, United States

2. Department of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh, Pennsylvania 15213, United States

3. Department of Chemical and Biomolecular Engineering, University of Houston, Houston, Texas 77204, United States

4. Materials Science and Engineering Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States

Funder

Basic Energy Sciences

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acsami.0c01807

Reference35 articles.

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