OH Surface Density of SiO2 and TiO2 by Thermogravimetric Analysis-Reference-Cited by-同舟云学术

OH Surface Density of SiO2 and TiO2 by Thermogravimetric Analysis

Published:2002-12-04 Issue:1 Volume:19 Page:160-165
ISSN:0743-7463
Container-title:Langmuir
language:en
Short-container-title:Langmuir

Author:

Mueller Roger¹,Kammler Hendrik K.¹,Wegner Karsten¹,Pratsinis Sotiris E.¹

Affiliation:

1. Particle Technology Laboratory, Department of Mechanical and Process Engineering, ETH Zurich, Sonneggstrasse 3, ML F25, CH-8092 Zurich, Switzerland

Publisher

American Chemical Society (ACS)

Subject

Electrochemistry,Spectroscopy,Surfaces and Interfaces,Condensed Matter Physics,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/la025785w

Reference25 articles.

1. Surface hydroxylation of silica

2. HYDROXYL CONTENT IN SILICA GEL “AEROSIL”

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