Effects of Cryogenic Sample Analysis on Molecular Depth Profiles with TOF-Secondary Ion Mass Spectrometry
Author:
Affiliation:
1. Surface Analysis Research Centre, Manchester Interdisciplinary Biocentre, School of Chemical Engineering and Analytical Science, The University of Manchester, Manchester M13 9PL, United Kingdom
Publisher
American Chemical Society (ACS)
Subject
Analytical Chemistry
Link
https://pubs.acs.org/doi/pdf/10.1021/ac101746h
Reference48 articles.
1. Secondary ion mass spectrometry using cluster primary ion beams
2. A C60 Primary Ion Beam System for Time of Flight Secondary Ion Mass Spectrometry: Its Development and Secondary Ion Yield Characteristics
3. ToF-SIMS imaging with cluster ion beams
4. The development of C60 and gold cluster ion guns for static SIMS analysis
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