Direct Imaging of Free Carrier and Trap Carrier Motion in Silicon Nanowires by Spatially-Separated Femtosecond Pump–Probe Microscopy-Reference-Cited by-同舟云学术

Direct Imaging of Free Carrier and Trap Carrier Motion in Silicon Nanowires by Spatially-Separated Femtosecond Pump–Probe Microscopy

Published:2013-02-26 Issue:3 Volume:13 Page:1336-1340
ISSN:1530-6984
Container-title:Nano Letters
language:en
Short-container-title:Nano Lett.

Author:

Gabriel Michelle M.¹,Kirschbrown Justin R.¹,Christesen Joseph D.¹,Pinion Christopher W.¹,Zigler David F.¹,Grumstrup Erik M.¹,Mehl Brian P.¹,Cating Emma E. M.¹,Cahoon James F.¹,Papanikolas John M.¹

Affiliation:

1. Department of Chemistry, University of North Carolina at Chapel Hill, Chapel Hill, North Carolina 27599-3290, United States

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

https://pubs.acs.org/doi/pdf/10.1021/nl400265b

Reference27 articles.

1. Coaxial multishell nanowires with high-quality electronic interfaces and tunable optical cavities for ultrathin photovoltaics

2. Tuning Light Absorption in Core/Shell Silicon Nanowire Photovoltaic Devices through Morphological Design

3. Design Principles for Photovoltaic Devices Based on Si Nanowires with Axial or Radial p–n Junctions

4. High-performance Si microwire photovoltaics

5. Pump–Probe Microscopy: Spatially Resolved Carrier Dynamics in ZnO Rods and the Influence of Optical Cavity Resonator Modes

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