Quantitative Measurement of the Mechanical Contribution to Tapping-Mode Atomic Force Microscopy Images of Soft Materials-Reference-Cited by-同舟云学术

Quantitative Measurement of the Mechanical Contribution to Tapping-Mode Atomic Force Microscopy Images of Soft Materials

Published:2000-09-30 Issue:22 Volume:16 Page:8432-8437
ISSN:0743-7463
Container-title:Langmuir
language:en
Short-container-title:Langmuir

Author:

Kopp-Marsaudon S.¹,Leclère Ph.¹,Dubourg F.¹,Lazzaroni R.¹,Aimé J. P.¹

Affiliation:

1. CPMOH Université de Bordeaux I, 351, cours de la Libération, F-33405 Talence Cedex, France, and Service de Chimie des Matériaux Nouveaux, Centre de Recherche en Science des Matériaux Polymères (CRESMAP), Université de Mons-Hainaut, Place du Parc, 20, B-7000 Mons, Belgium

Publisher

American Chemical Society (ACS)

Subject

Electrochemistry,Spectroscopy,Surfaces and Interfaces,Condensed Matter Physics,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/la0005098

Reference16 articles.

1. Frequency modulation detection using high‐Qcantilevers for enhanced force microscope sensitivity

2. Fractured polymer/silica fiber surface studied by tapping mode atomic force microscopy

3. Tapping-mode atomic force microscopy study of the near-surface composition of a styrene-butadiene-styrene triblock copolymer film

4. Surface Reconstruction of the Lamellar Morphology in a Symmetric Poly(styrene-block-butadiene-block-methyl methacrylate) Triblock Copolymer: A Tapping Mode Scanning Force Microscope Study

5. Microdomain Morphology Analysis of Block Copolymers by Atomic Force Microscopy with Phase Detection Imaging

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