X-ray Microscopy Imaging of the Grain Orientation in a Pentacene Field-Effect Transistor-Reference-Cited by-同舟云学术

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X-ray Microscopy Imaging of the Grain Orientation in a Pentacene Field-Effect Transistor

Published:2010-05-19 Issue:12 Volume:22 Page:3693-3697
ISSN:0897-4756
Container-title:Chemistry of Materials
language:en
Short-container-title:Chem. Mater.

Author:

Bräuer Björn¹,Virkar Ajay²,Mannsfeld Stefan C. B.³,Bernstein David P.¹,Kukreja Roopali⁴,Chou Kang Wei⁵,Tyliszczak Tolek⁵,Bao Zhenan²,Acremann Yves⁴

Affiliation:

1. SIMES Center, SLAC National Accelerator Laboratory

2. Department of Chemical Engineering

3. SSRL, SLAC National Accelerator Laboratory, Stanford, California 94309

4. PULSE Center, SLAC National Accelerator Laboratory

5. Advanced Light Source, Berkeley, California 94720

Publisher

American Chemical Society (ACS)

Subject

Materials Chemistry,General Chemical Engineering,General Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/cm100487j

Reference47 articles.

1. Flexible active-matrix displays and shift registers based on solution-processed organic transistors

2. Pentacene-based radio-frequency identification circuitry

3. High Performance Organic Thin Film Transistors

4. Highly ordered vacuum-deposited thin films of metallophthalocyanines and their applications in field-effect transistors

5. Interface-Controlled, High-Mobility Organic Transistors

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1. Correlating Morphology, Molecular Orientation, and Transistor Performance of Bis(pentafluorophenoxy)silicon Phthalocyanine Using Scanning Transmission X-ray Microscopy;Chemistry of Materials;2022-05-09

2. Metal phthalocyanines: thin-film formation, microstructure, and physical properties;RSC Advances;2021

3. Correlating Nanoscale Optical Coherence Length and Microscale Topography in Organic Materials by Coherent Two-Dimensional Microspectroscopy;Nano Letters;2020-08-10

4. Influence of gamma-ray irradiation and post-annealing studies on pentacene films: the anisotropic effects on structural and electronic properties;RSC Advances;2020

5. Study of local structure at crystalline rubrene grain boundaries via scanning transmission X-ray microscopy;Organic Electronics;2019-11

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