Atomic Force Microscope Based Kelvin Probe Measurements: Application to an Electrochemical Reaction-Reference-Cited by-同舟云学术

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Atomic Force Microscope Based Kelvin Probe Measurements: Application to an Electrochemical Reaction

Published:1997-12-01 Issue:49 Volume:101 Page:10162-10165
ISSN:1520-6106
Container-title:The Journal of Physical Chemistry B
language:en
Short-container-title:J. Phys. Chem. B

Author:

Böhmisch M.¹,Burmeister F.¹,Rettenberger A.¹,Zimmermann J.¹,Boneberg J.¹,Leiderer P.¹

Affiliation:

1. Universität Konstanz, Fakultät für Physik, D-78434 Konstanz, Germany

Publisher

American Chemical Society (ACS)

Subject

Materials Chemistry,Surfaces, Coatings and Films,Physical and Theoretical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/jp9728767

Reference36 articles.

1. Contributions of scanning probe microscopy and spectroscopy to the investigation and fabrication of nanometer-scale structures

2. Atomic and Nanometer-Scale Modification of Materials: Fundamentalsand Applications; Avouris, P., Ed.; NATO ASI Series; Kluwer: Netherlands, 1993.

3. Submicron probe of polymer adhesion with atomic force microscopy: Dependence on topography and material inhomogeneities

4. Functional Group Imaging by Adhesion AFM Applied to Lipid Monolayers

5. Friction measurements on phase-separated thin films with a modified atomic force microscope

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