Bright Cathodoluminescent Thin Films for Scanning Nano-Optical Excitation and Imaging-Reference-Cited by-同舟云学术

Bright Cathodoluminescent Thin Films for Scanning Nano-Optical Excitation and Imaging

Published:2013-10-25 Issue:11 Volume:7 Page:10397-10404
ISSN:1936-0851
Container-title:ACS Nano
language:en
Short-container-title:ACS Nano

Author:

Kaz David M.,Bischak Connor G.,Hetherington Craig L.,Howard Hannah H.,Marti Xavier,Clarkson James D.,Adamo Carolina¹,Schlom Darrell G.¹²,Ramesh Ramamoorthy,Aloni Shaul,Ogletree D. Frank,Ginsberg Naomi S.³

Affiliation:

1. Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853, United States

2. Kavli Institute at Cornell for Nanoscale Science, Ithaca, New York, 14853, United States

3. Kavli Energy NanoSciences Institute, Berkeley, California 94720, United States

Publisher

American Chemical Society (ACS)

Subject

General Physics and Astronomy,General Engineering,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/nn404911a

Reference55 articles.

1. Far-Field Optical Nanoscopy

2. Nonlinear structured-illumination microscopy: Wide-field fluorescence imaging with theoretically unlimited resolution

3. Imaging Intracellular Fluorescent Proteins at Nanometer Resolution

4. Sub-diffraction-limit imaging by stochastic optical reconstruction microscopy (STORM)

5. Ultra-High Resolution Imaging by Fluorescence Photoactivation Localization Microscopy

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