In Situ Infrared Characterization during Atomic Layer Deposition of Lanthanum Oxide-Reference-Cited by-同舟云学术

In Situ Infrared Characterization during Atomic Layer Deposition of Lanthanum Oxide

Published:2008-12-19 Issue:2 Volume:113 Page:654-660
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Kwon Jinhee¹,Dai Min¹,Halls Mathew D.¹,Langereis Erik¹,Chabal Yves J.¹,Gordon Roy G.¹

Affiliation:

1. Department of Materials Science and Engineering, University of Texas at Dallas, Richardson, Texas 75080, Laboratory for Surface Modification, Rutgers University, Piscataway, New Jersey 08854, Materials Science Division, Accelrys Inc., San Diego, California 92121, Applied Physics, Plasma and Materials Processing, Eindhoven University of Technology, Eindhoven, The Netherlands, Department of Chemistry and Chemical Biology, Harvard University, Cambridge, Massachusetts 02138

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/jp806027m

Reference41 articles.

1. Synthesis, characterization of homoleptic lanthanide amidinate complexes and their catalytic activity for the ring-opening polymerization of ε-caprolactone

2. Paramagnetic Bis(amidinate) Iron(II) Complexes and their Diamagnetic Dicarbonyl Derivatives

3. The syntheses and structures of some main group complexes of the sterically hindered N,N′-bis(2,6-diisopropylphenyl)-4-toluamidinate ligand

4. Principal trends in the chemistry of amidinate complexes of main-group and transition elements

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