Preparation, Transport Properties, and Structure Analysis by Resonant X-ray Scattering of the Type I Clathrate Cs8Cd4Sn42-Reference-Cited by-同舟云学术

Preparation, Transport Properties, and Structure Analysis by Resonant X-ray Scattering of the Type I Clathrate Cs8Cd4Sn42

Published:2002-02-28 Issue:3 Volume:14 Page:1300-1305
ISSN:0897-4756
Container-title:Chemistry of Materials
language:en
Short-container-title:Chem. Mater.

Author:

Wilkinson A. P.¹,Lind C.¹,Young R. A.¹,Shastri S. D.¹,Lee P. L.¹,Nolas G. S.¹

Affiliation:

1. School of Chemistry and Biochemistry, Georgia Institute of Technology, Atlanta, Georgia 30332-0400; School of Physics, Georgia Institute of Technology, Atlanta, Georgia 30332-0430; SRI-CAT, Advanced Photon Source, Argonne National Laboratory, Illinois 60439-4803; and Department of Physics, University of South Florida, Tampa, Florida 33620-5700

Publisher

American Chemical Society (ACS)

Subject

Materials Chemistry,General Chemical Engineering,General Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/cm0107880

Reference44 articles.

1. Clathrate Structure of Silicon Na 8 Si 46 and Na x Si 136 ( x < 11)

2. Die verbindungen AII8BIII16BIV30 (AII ≡ Sr, Ba; BIII≡ Al, Ga; BIV ≡ Si, Ge, Sn) und ihre käfigstrukturen

3. Clathrates of Group 14 with Alkali Metals: An Exploration

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