Excess-Electron Transfer in DNA by a Fluctuation-Assisted Hopping Mechanism
Author:
Affiliation:
1. The Institute of Scientific and Industrial Research (SANKEN), Osaka University, Mihogaoka 8-1, Ibaraki, Osaka 567-0047, Japan
Funder
Ministry of Education, Culture, Sports, Science, and Technology
Publisher
American Chemical Society (ACS)
Subject
Materials Chemistry,Surfaces, Coatings and Films,Physical and Theoretical Chemistry
Link
https://pubs.acs.org/doi/pdf/10.1021/acs.jpcb.5b10857
Reference74 articles.
1. Biological consequences of free radical-damaged DNA bases1,2 1Guest Editor: Miral Dizdaroglu 2This article is part of a series of reviews on “Oxidative DNA Damage and Repair.” The full list of papers may be found on the homepage of the journal.
2. Long-range radical cation migration in DNA: Investigation of the mechanism
3. Mechanisms for DNA Charge Transport
4. Toward DNA Conductivity: A Theoretical Perspective
5. Sequence Dependent Long Range Hole Transport in DNA
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