EMR Study and DFT-Assisted Identification of Transient Radicals in X-Irradiated Crystalline Sucrose-Reference-Cited by-同舟云学术

EMR Study and DFT-Assisted Identification of Transient Radicals in X-Irradiated Crystalline Sucrose

Published:2015-05-20 Issue:22 Volume:119 Page:6562-6570
ISSN:1520-6106
Container-title:The Journal of Physical Chemistry B
language:en
Short-container-title:J. Phys. Chem. B

Author:

Kusakovskij Jevgenij¹,Callens Freddy¹,Vrielinck Henk¹

Affiliation:

1. Department of Solid State Sciences, Ghent University, Krijgslaan 281-S1, 9000 Gent, Belgium

Funder

Special Research Fund, Ghent University

Publisher

American Chemical Society (ACS)

Subject

Materials Chemistry,Surfaces, Coatings and Films,Physical and Theoretical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.jpcb.5b02468

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