Diffraction Line Profiles in the Rietveld Method
Author:
Affiliation:
1. Department of Civil, Environmental & Mechanical Engineering, University of Trento, via Mesiano 77, 38123, Trento, Italy
Publisher
American Chemical Society (ACS)
Subject
Condensed Matter Physics,General Materials Science,General Chemistry
Link
http://pubs.acs.org/doi/pdf/10.1021/acs.cgd.0c00956
Reference84 articles.
1. Line profiles of neutron powder-diffraction peaks for structure refinement
2. A profile refinement method for nuclear and magnetic structures
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4. Least-squares structure refinement based on profile analysis of powder film intensity data measured on an automatic microdensitometer
5. Application of the pattern-fitting structure-refinement method of X-ray powder diffractometer patterns
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