Simultaneous Monitoring of Molecular Thin Film Morphology and Crystal Structure by X-ray Scattering-Reference-Cited by-同舟云学术

Simultaneous Monitoring of Molecular Thin Film Morphology and Crystal Structure by X-ray Scattering

Published:2020-06-29 Issue:8 Volume:20 Page:5269-5276
ISSN:1528-7483
Container-title:Crystal Growth & Design
language:en
Short-container-title:Crystal Growth & Design

Author:

Mrkyvkova Nada¹²^ORCID,Nadazdy Peter¹,Hodas Martin³^ORCID,Chai Jianwei⁴,Wang Shijie⁴,Chi Dongzhi⁴^ORCID,Sojkova Michaela⁵^ORCID,Hulman Martin⁵^ORCID,Chumakov Andrei⁶,Konovalov Oleg V.⁶,Hinderhofer Alexander³^ORCID,Jergel Matej¹²^ORCID,Majkova Eva¹²^ORCID,Siffalovic Peter¹²^ORCID,Schreiber Frank³

Affiliation:

1. Institute of Physics, Slovak Academy of Sciences, Dúbravská cesta 9, Bratislava 84511, Slovakia

2. Centre for Advanced Materials Application, Slovak Academy of Sciences, Dúbravská cesta 9, Bratislava 84511, Slovakia

3. Institut für Angewandte Physik, Universität Tübingen, Auf der Morgenstelle 10, 72076 Tübingen, Germany

4. Institute of Materials Research & Engineering (IMRE), A*STAR (Agency for Science, Technology and Research), 2 Fusionopolis Way, Innovis, Singapore 138634

5. Institute of Electrical Engineering, Slovak Academy of Sciences, Dúbravská cesta 9, 845 11 Bratislava, Slovakia

6. European Synchrotron Radiation Facility, 71 avenue des Martyrs, Grenoble 38000, France

Funder

Deutscher Akademischer Austauschdienst

European Regional Development Fund

Deutsche Forschungsgemeinschaft

Agent?ra Ministerstva ?kolstva, vedy, v?skumu a ?portu SR

Alexander von Humboldt-Stiftung

Slovensk? Akad?mia Vied

Science and Engineering Research Council

Agent?ra na Podporu V?skumu a V?voja

Publisher