Evaluation of Local Stress Distributions and Dislocations Around Petal Patterns Observed in CVD Single Crystal Diamond Plates-Reference-Cited by-同舟云学术

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Evaluation of Local Stress Distributions and Dislocations Around Petal Patterns Observed in CVD Single Crystal Diamond Plates

Published:2023-07-05 Issue:8 Volume:23 Page:5671-5676
ISSN:1528-7483
Container-title:Crystal Growth & Design
language:en
Short-container-title:Crystal Growth & Design

Author:

Tsubouchi Nobuteru¹^ORCID,Nomura Katsuhiro²^ORCID

Affiliation:

1. Advanced Power Electronics Research Center, National Institute of Advanced Industrial Science and Technology (AIST), Ikeda 563-8577, Japan

2. Innovative Functional Materials Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Nagoya 463-8560, Japan

Funder

Japan Society for the Promotion of Science

Publisher

American Chemical Society (ACS)

Subject

Condensed Matter Physics,General Materials Science,General Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.cgd.3c00333

Reference25 articles.

1. Residual strain around grown-in defects in CVD diamond single crystals: A 2D and 3D Raman imaging study

2. Structural defects in homoepitaxial diamond layers grown on off-axis Ib HPHT substrates

3. Diamond Raman laser with continuously tunable output from 338 to 380 μm

4. Nonlinear behavior of current-dependent emission for diamond light-emitting diodes

5. Hatano, M.; Iwasaki, T.; Yamasaki, S.; Makino, T. Diamond electronics. Proceedings of the 46th European Solid-State Device Research Conference; IEEE: Lausanne, Switzerland, 2016; pp 330–332. September 2–15.

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