Probing the Annealing-Induced Phase Evolution of Nanostructured Manganese Oxide Thin Films by X-Ray Diffraction-Reference-Cited by-同舟云学术

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Probing the Annealing-Induced Phase Evolution of Nanostructured Manganese Oxide Thin Films by X-Ray Diffraction

Published:2024-01-11 Issue:3 Volume:24 Page:1254-1267
ISSN:1528-7483
Container-title:Crystal Growth & Design
language:en
Short-container-title:Crystal Growth & Design

Author:

Macrelli Andrea¹^ORCID,Lamperti Alessio²^ORCID,Dellasega David¹^ORCID,Russo Valeria¹^ORCID,Casari Carlo S.¹^ORCID,Li Bassi Andrea¹^ORCID

Affiliation:

1. Micro and Nanostructured Materials Lab (NanoLab), Department of Energy, Politecnico di Milano, Via G. Ponzio 34/3, Milano 20133, Italy

2. Institute for Microelectronics and Microsystems (IMM), Consiglio Nazionale delle Ricerche (CNR), Unit of Agrate Brianza, Via C. Olivetti 2, Agrate Brianza, MB 20864, Italy

Funder

European Commission

Ministero dell'Universit? e della Ricerca

Publisher

American Chemical Society (ACS)

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.cgd.3c01241

Reference74 articles.

1. Nanostructured Mn-based oxides for electrochemical energy storage and conversion

2. A review of Mn-containing oxide catalysts for low temperature selective catalytic reduction of NOx with NH3: reaction mechanism and catalyst deactivation

3. Review on manganese dioxide for catalytic oxidation of airborne formaldehyde

4. Biosensors Based on MnO2 Nanostructures: A Review

5. A critical review of the reactivity of manganese oxides with organic contaminants

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