Multielement Analysis of Graphite and Silicon Carbide by Inductively Coupled Plasma Atomic Emission Spectrometry Using Solid Sampling and Electrothermal Vaporization-Reference-Cited by-同舟云学术

Multielement Analysis of Graphite and Silicon Carbide by Inductively Coupled Plasma Atomic Emission Spectrometry Using Solid Sampling and Electrothermal Vaporization

Published:1999-01-20 Issue:4 Volume:71 Page:849-854
ISSN:0003-2700
Container-title:Analytical Chemistry
language:en
Short-container-title:Anal. Chem.

Author:

Schäffer Uwe¹,Krivan Viliam¹

Affiliation:

1. Sektion Analytik und Höchstreinigung, Universität Ulm, D-89069 Ulm, Germany

Publisher

American Chemical Society (ACS)

Subject

Analytical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/ac980821a

Reference36 articles.

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3. Taylor, H. A., Jr.; et al.Kirk-Othmer: Encyclopedia of Chemical Technology;John Wiley & Sons: New York, 1991; Vol. 4, pp 949−1116.

4. Pure graphite as a reference material for the determination of trace elements — an interlaboratory collaborative study

5. Keramik

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