In-Line Monitoring of the Thickness of Printed Layers by NIR Spectroscopy: Elimination of the Effect of the Varnish Formulation on the Prediction of the Coating Weight-Reference-Cited by-同舟云学术

In-Line Monitoring of the Thickness of Printed Layers by NIR Spectroscopy: Elimination of the Effect of the Varnish Formulation on the Prediction of the Coating Weight

Published:2013-11-26 Issue:50 Volume:52 Page:17735-17743
ISSN:0888-5885
Container-title:Industrial & Engineering Chemistry Research
language:en
Short-container-title:Ind. Eng. Chem. Res.

Author:

Daikos Olesya¹,Mirschel Gabriele¹,Genest Beatrix²,Scherzer Tom¹

Affiliation:

1. Leibniz Institute of Surface Modification (IOM) Permoserstraße 15, D-04318 Leipzig, Germany

2. Saxonian Institute for the Printing Industry (SID) Mommsenstraße 2, D-04329 Leipzig, Germany

Publisher

American Chemical Society (ACS)

Subject

Industrial and Manufacturing Engineering,General Chemical Engineering,General Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/ie403087k

Reference43 articles.

1. NIR spectroscopy: a rapid-response analytical tool

2. Lavine, B. K.; Workman, J.Chemometrics: Past, Present, and Future, InChemometrics and Chemoinformatics;ACS Symp. Ser.Vol.894;Lavine, B. K.Ed.ACS;Washington, DC, 2005; p1.

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