Energy Dispersive X-ray Reflectometry of the NO2 Interaction with Ruthenium Phthalocyanine Films-Reference-Cited by-同舟云学术

Energy Dispersive X-ray Reflectometry of the NO2 Interaction with Ruthenium Phthalocyanine Films

Published:2002-12-18 Issue:2 Volume:107 Page:575-579
ISSN:1520-6106
Container-title:The Journal of Physical Chemistry B
language:en
Short-container-title:J. Phys. Chem. B

Author:

Generosi Amanda¹,Albertini Valerio Rossi¹,Rossi Gentilina¹,Pennesi Giovanna¹,Caminiti Ruggero¹

Affiliation:

1. Istituto di Struttura della Materia (CNR), Via del Fosso del Cavaliere 100, 00133 Roma, Italy, Istituto di Struttura della Materia (CNR), Via Salaria Km.29.5, CP10 Monterotondo Stazione, Roma, Italy, and Dipartimento di Chimica, Istituto Nazionale per la Fisica della Materia, Università di Roma “La Sapienza”, P.le Aldo Moro 5, Roma, Italy

Publisher

American Chemical Society (ACS)

Subject

Materials Chemistry,Surfaces, Coatings and Films,Physical and Theoretical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/jp021846n

Reference14 articles.

1. Molecular Semiconductors

2. Snow, A. W.; Barger W. R. InPhthalocyanines. Properties andApplications; Leznoff, C. C., Lever, A. B., Eds.; VCH Pubblishers, (LSK) Ltd. Cambridge, U.K., 1989; Vol. 1, p 341.

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