Publisher
American Chemical Society (ACS)
Cited by
29 articles.
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1. Quantitative surface analysis by XPS and XAS;Surface and Interface Analysis;1988-07
2. Röntgen-Photoelektronen-Spektrometrie;Angewandte Oberflächenanalyse mit SIMS Sekundär-Ionen-Massenspektrometrie AES Auger-Elektronen-Spektrometrie XPS Röntgen-Photoelektronen-Spektrometrie;1986
3. La spectroscopie de photoélectrons induits par rayons X et la répartition des ions cuivre Cu+ et Cu2+ dans les ferrites de cuivre;Journal of Solid State Chemistry;1981-09
4. Recent Study of Solid Surfaces by Photoelectron Spectroscopy;Applied Spectroscopy Reviews;1980-01
5. Relative Cl 2p:P 2s photoionization intensities in transition metal complexes;Journal of Electron Spectroscopy and Related Phenomena;1979-01