Evidence of the Substrate Effect in Hydrogen Electroinsertion into Palladium Atomic Layers by Means of in Situ Surface X-ray Diffraction-Reference-Cited by-同舟云学术

Evidence of the Substrate Effect in Hydrogen Electroinsertion into Palladium Atomic Layers by Means of in Situ Surface X-ray Diffraction

Published:2009-03-10 Issue:8 Volume:25 Page:4251-4255
ISSN:0743-7463
Container-title:Langmuir
language:en
Short-container-title:Langmuir

Author:

Lebouin Chrystelle¹,Soldo-Olivier Yvonne¹,Sibert Eric¹,De Santis Maurizio²³,Maillard Frédéric¹,Faure René¹

Affiliation:

1. Laboratoire d’Electrochimie et de Physicochimie des Matériaux et des Interfaces, CNRS-Grenoble INP-UJF, 1130 rue de la Piscine, 38402 Saint Martin d’Hères, France

2. Institut Néel, CNRS-UJF, 25 avenue des Martyrs, BP 166, 38042 Grenoble Cedex 9, France

3. Institut für Allgemeine Physik, Technische Universität Wien, A-1040 Wien, Austria

Publisher

American Chemical Society (ACS)

Subject

Electrochemistry,Spectroscopy,Surfaces and Interfaces,Condensed Matter Physics,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/la803913e

Reference40 articles.

1. Electrochemical characterization of a hydride-forming metal alloy surface-modified with palladium

2. Electrochemical loading of hydrogen in palladium capped samarium thin film: structural, electrical, and optical properties

3. Studies on the influence of palladium coatings on the electrochemical and structural properties of a metal hydride alloy

4. Pressure-induced phase transitions of theLiAlD4system

5. Palladium adsorption on Pt(111): a combined electrochemical and ultra-high vacuum study

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