High Resolution K Capture X-ray Fluorescence Spectroscopy: A New Tool for Chemical Characterization-Reference-Cited by-同舟云学术

High Resolution K Capture X-ray Fluorescence Spectroscopy: A New Tool for Chemical Characterization

Published:1999-05-01 Issue:20 Volume:121 Page:4926-4927
ISSN:0002-7863
Container-title:Journal of the American Chemical Society
language:en
Short-container-title:J. Am. Chem. Soc.

Author:

Bergmann U.¹,Glatzel P.¹,deGroot F.¹,Cramer S. P.¹

Affiliation:

1. Physical Biosciences Division Lawrence Berkeley National Laboratory Berkeley, California 94720 Department of Applied Science University of California Davis, California 95616 Department of Chemistry Universiteit Utrecht 3584 CA Utrecht, The Netherlands

Publisher

American Chemical Society (ACS)

Subject

Colloid and Surface Chemistry,Biochemistry,General Chemistry,Catalysis

Link

https://pubs.acs.org/doi/pdf/10.1021/ja984454w

Reference23 articles.

1. Electron Interaction in Transition Metal X-ray Emission Spectra

2. Site-Selective XANES and EXAFS: A Demonstration with Manganese Mixtures and Mixed-Valence Complexes

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