Side-by-Side Comparison of DNA Damage Induced by Low-Energy Electrons and High-Energy Photons with Solid TpTpT Trinucleotide-Reference-Cited by-同舟云学术

Side-by-Side Comparison of DNA Damage Induced by Low-Energy Electrons and High-Energy Photons with Solid TpTpT Trinucleotide

Published:2013-08-23 Issue:35 Volume:117 Page:10122-10131
ISSN:1520-6106
Container-title:The Journal of Physical Chemistry B
language:en
Short-container-title:J. Phys. Chem. B

Author:

Park Yeunsoo¹²,Peoples Anita R.³,Madugundu Guru S.¹,Sanche Léon¹,Wagner J. Richard¹

Affiliation:

1. Department of Nuclear Medicine and Radiobiology, Faculty of Medicine and Heath Sciences, Université de Sherbrooke, Sherbrooke, Quebec, Canada J1H 5N4

2. Fundamental Technology Division, Plasma Technology Research Center, National Fusion Research Institute, Gunsan, Jeollabuk-do, South Korea 573-540

3. Department of Biochemistry and Biophysics, School of Medicine and Dentistry, University of Rochester, Rochester, New York 14642, United States

Publisher

American Chemical Society (ACS)

Subject

Materials Chemistry,Surfaces, Coatings and Films,Physical and Theoretical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/jp405397m

Reference62 articles.

1. Free-Radical-Induced DNA Damage and Its Repair

2. Assessing cancer risks of low-dose radiation

3. Strategies to improve radiotherapy with targeted drugs

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