Electrochemically Grown Tin Oxide Thin Films: In Situ Characterization of Electronic Properties and Growth Mechanism-Reference-Cited by-同舟云学术

Electrochemically Grown Tin Oxide Thin Films: In Situ Characterization of Electronic Properties and Growth Mechanism

Published:2004-05-19 Issue:24 Volume:108 Page:8173-8181
ISSN:1520-6106
Container-title:The Journal of Physical Chemistry B
language:en
Short-container-title:J. Phys. Chem. B

Author:

Díaz Raül¹,Joiret Suzanne¹,Cuesta Ángel¹,Díez-Pérez Ismael¹,Allongue Philippe¹,Gutiérrez Claudio¹,Gorostiza Pau¹,Sanz Fausto¹

Affiliation:

1. LCTEM, Departament de Química Física, Universitat de Barcelona, Martí i Franquès 1, 08028-Barcelona, Spain, Laboratoire des Systèmes et Interfaces Electrochimiques, UPR 15 du CNRS, Université Paris 6, 4 Place Jussieu, Tour 22, 75005 Paris, France, and Instituto de Química Física “Rocasolano”, CSIC, C. Serrano 119, 28006 Madrid, Spain

Publisher

American Chemical Society (ACS)

Subject

Materials Chemistry,Surfaces, Coatings and Films,Physical and Theoretical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/jp037530c

Reference67 articles.

1. Anodic passivation of tin in sodium hydroxide solutions

2. Optical Properties and the Effective Carrier Mass in Degenerate Tin-Oxide (SnO2) Films Prepared by Chemical Vapour Deposition

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