Imaging of the Schottky Barriers and Charge Depletion in Carbon Nanotube Transistors-Reference-Cited by-同舟云学术

Imaging of the Schottky Barriers and Charge Depletion in Carbon Nanotube Transistors

Published:2007-06-09 Issue:7 Volume:7 Page:2037-2042
ISSN:1530-6984
Container-title:Nano Letters
language:en
Short-container-title:Nano Lett.

Author:

Freitag Marcus¹,Tsang James C.¹,Bol Ageeth¹,Yuan Dongning¹,Liu Jie¹,Avouris Phaedon¹

Affiliation:

1. IBM T. J. Watson Research Center, 1101 Kitchawan Road, Yorktown Heights, New York 10598, and Department of Chemistry, Duke University, Durham, North Carolina 27708

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

https://pubs.acs.org/doi/pdf/10.1021/nl070900e

Reference22 articles.

1. Electronics with carbon nanotubes

2. Novel Length Scales in Nanotube Devices

3. Carbon Nanotubes as Schottky Barrier Transistors

4. Controlled creation of a carbon nanotube diode by a scanned gate

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