Ultrastable Atomic Force Microscopy: Atomic-Scale Stability and Registration in Ambient Conditions-Reference-Cited by-同舟云学术

Ultrastable Atomic Force Microscopy: Atomic-Scale Stability and Registration in Ambient Conditions

Published:2009-03-12 Issue:4 Volume:9 Page:1451-1456
ISSN:1530-6984
Container-title:Nano Letters
language:en
Short-container-title:Nano Lett.

Author:

King Gavin M.¹,Carter Ashley R.¹,Churnside Allison B.¹,Eberle Louisa S.¹,Perkins Thomas T.¹

Affiliation:

1. JILA, National Institute of Standards and Technology, and University of Colorado, Boulder, Colorado 80309, Department of Physics, Department of Molecular, Cellular, and Developmental Biology, University of Colorado, Boulder, Colorado 80309, and Denver School of Science and Technology, Denver, Colorado 80238

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

https://pubs.acs.org/doi/pdf/10.1021/nl803298q

Reference31 articles.

1. Advances in atomic force microscopy

2. Single-molecule studies of membrane proteins

3. "Dip-Pen" Nanolithography

4. Nanotubes as nanoprobes in scanning probe microscopy

5. Ultra-sensitive NEMS-based cantilevers for sensing, scanned probe and very high-frequency applications

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