Exploring the Electronic and Mechanical Properties of Protein Using Conducting Atomic Force Microscopy-Reference-Cited by-同舟云学术

Exploring the Electronic and Mechanical Properties of Protein Using Conducting Atomic Force Microscopy

Published:2004-04-13 Issue:17 Volume:126 Page:5601-5609
ISSN:0002-7863
Container-title:Journal of the American Chemical Society
language:en
Short-container-title:J. Am. Chem. Soc.

Author:

Zhao Jianwei¹,Davis Jason J.¹,Sansom Mark S. P.¹,Hung Andrew¹

Affiliation:

1. Contribution from the Inorganic Chemistry Laboratory, Department of Chemistry, South Parks Road, Oxford, OX1 3QR; Bionanotechnology IRC, Clarendon Laboratory, Department of Physics, University of Oxford, Parks Road, Oxford OX1 3PU, and Laboratory of Molecular Biophysics, Department of Biochemistry, University of Oxford, South Parks Road, OX1 3QU United Kingdom

Publisher

American Chemical Society (ACS)

Subject

Colloid and Surface Chemistry,Biochemistry,General Chemistry,Catalysis

Link

https://pubs.acs.org/doi/pdf/10.1021/ja039392a

Reference65 articles.

1. Energy Transport and Trapping in Polymeric Media: Small-World Networks

2. Electronic rectification in protein devices

3. Protein Folding Triggered by Electron Transfer

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