Electrical Transport Properties of Au Nanoparticles and Thin Films on Ge Probed Using a Conducting Atomic Force Microscope
Author:
Affiliation:
1. Department of Physics, College of Sciences, ‡Institute of NanoMicroEnergy, College of Science, §Shanghai Key Laboratory of High Temperature Superconductor, ∥Department of Chemistry, College of Sciences, Shanghai University, Shanghai 200444, China
Funder
Natural Science Foundation of Shanghai
National Natural Science Foundation of China
Shanghai Key Laboratory of High Temperature Superconductors, Shanghai University
Publisher
American Chemical Society (ACS)
Subject
Electrochemistry,Spectroscopy,Surfaces and Interfaces,Condensed Matter Physics,General Materials Science
Link
https://pubs.acs.org/doi/pdf/10.1021/acs.langmuir.6b02232
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