Insight into the Experimental Error in the Mapping of Electrical Properties with Electrostatic Force Microscopy
Author:
Affiliation:
1. State Key Laboratory of Power System, Department of Electrical Engineering, Tsinghua University, Beijing 100084, People’s Republic of China
Funder
National Natural Science Foundation of China
Publisher
American Chemical Society (ACS)
Subject
Electrochemistry,Spectroscopy,Surfaces and Interfaces,Condensed Matter Physics,General Materials Science
Link
https://pubs.acs.org/doi/pdf/10.1021/acs.langmuir.2c00604
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