Determining the Characteristics of Ultrathin Polymer Films: A Spectroscopic Ellipsometry Approach-Reference-Cited by-同舟云学术

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Determining the Characteristics of Ultrathin Polymer Films: A Spectroscopic Ellipsometry Approach

Published:2024-06-24 Issue:27 Volume:40 Page:14153-14165
ISSN:0743-7463
Container-title:Langmuir
language:en
Short-container-title:Langmuir

Author:

Bhutia Sonam Zangpo¹²^ORCID,Sukumaran Sathish K.³,Satapathy Dillip K.¹²^ORCID

Affiliation:

1. Soft Materials Laboratory, Department of Physics, IIT Madras, Chennai 600036, India

2. Center for Soft and Biological Matter, IIT Madras, Chennai 600036, India

3. Graduate School of Organic Materials Science, Yamagata University, 4-3-16 Jonan, Yonezawa 992-8510, Japan

Funder

Council of Scientific and Industrial Research, India

University Grants Commission

Indian Institute of Technology Madras

Japan Society for the Promotion of Science

Ministry of Education, India

Publisher

American Chemical Society (ACS)

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.langmuir.4c01761

Reference66 articles.

1. Programmable polymer thin film and non-volatile memory device

2. Effects of confinement on material behaviour at the nanometre size scale

3. Soft Confinement Effects on Dynamics of Hydrated Gelatin

4. Size-Dependent Shape Evolution of Patterned Polymer Films Studied in Situ by Phase-Retrieval-Based Small-Angle X-ray Scattering

5. Extension of rotating-analyzer ellipsometry to generalized ellipsometry: determination of the dielectric function tensor from uniaxial TiO_2

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