Impact of Premetallization Surface Preparation on Nickel-based Ohmic Contacts to Germanium Telluride: An X-ray Photoelectron Spectroscopic Study-Reference-Cited by-同舟云学术

Impact of Premetallization Surface Preparation on Nickel-based Ohmic Contacts to Germanium Telluride: An X-ray Photoelectron Spectroscopic Study

Published:2016-12-07 Issue:50 Volume:8 Page:34802-34809
ISSN:1944-8244
Container-title:ACS Applied Materials & Interfaces
language:en
Short-container-title:ACS Appl. Mater. Interfaces

Author:

Aldosari Haila M.¹^ORCID,Simchi Hamed¹^ORCID,Ding Zelong¹,Cooley Kayla A.¹,Yu Shih-Ying¹,Mohney Suzanne E.¹

Affiliation:

1. Department of Materials Science and Engineering and Materials Research Institute, The Pennsylvania State University, University Park, Pennsylvania 16802, United States

Funder

Office of Naval Research

United Arab Emirates University

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acsami.6b07412

Reference25 articles.

1. Low-loss latching microwave switch using thermally pulsed non-volatile chalcogenide phase change materials

2. Low resistance, high dynamic range reconfigurable phase change switch for radio frequency applications

3. Development of cap-free sputtered GeTe films for inline phase change switch based RF circuits

4. Effect of metals and annealing on specific contact resistivity of GeTe/metal contacts

5. XPS study of fresh and oxidized GeTe and (Ge,Sn)Te surface

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