Reflectometry–Ellipsometry Reveals Thickness, Growth Rate, and Phase Composition in Oxidation of Copper-Reference-Cited by-同舟云学术

Reflectometry–Ellipsometry Reveals Thickness, Growth Rate, and Phase Composition in Oxidation of Copper

Published:2016-08-16 Issue:34 Volume:8 Page:22337-22344
ISSN:1944-8244
Container-title:ACS Applied Materials & Interfaces
language:en
Short-container-title:ACS Appl. Mater. Interfaces

Author:

Diaz Leon Juan J.¹²,Fryauf David M.¹²,Cormia Robert D.³,Zhang Min-Xian Max⁴,Samuels Kathryn⁴,Williams R. Stanley⁴,Kobayashi Nobuhiko P.¹²

Affiliation:

1. Baskin School of Engineering, University of California Santa Cruz, Santa Cruz, California 95064, United States

2. Nanostructured Energy Conversion Technology and Research (NECTAR), Advanced Studies Laboratories, University of California Santa Cruz—NASA Ames Research Center, Moffett Field, California 94035, United States

3. Foothill College, Los Altos, California 94022, United States

4. Hewlett-Packard Labs, Palo Alto, California 94304, United States

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acsami.6b06626

Reference39 articles.

1. Atomistic details of oxide surfaces and surface oxidation: the example of copper and its oxides

2. Oxidation of Polycrystalline Copper Thin Films at Ambient Conditions

3. Investigation of Room Temperature Oxidation of Cu in Air by Yoneda-XAFS

4. Native Oxide Layers Formed on the Surface of Ultra High-Purity Iron and Copper Investigated by Angle Resolved XPS

5. XPS and DFT Studies on the Autoxidation Process of Cu Sheet at Room Temperature

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