Electron Thermal Microscopy-Reference-Cited by-同舟云学术

Electron Thermal Microscopy

Published:2008-01-30 Issue:2 Volume:8 Page:582-585
ISSN:1530-6984
Container-title:Nano Letters
language:en
Short-container-title:Nano Lett.

Author:

Brintlinger Todd¹,Qi Yi¹,Baloch Kamal H.¹,Goldhaber-Gordon David¹,Cumings John¹

Affiliation:

1. Department of Materials Science and Engineering, Center for Nanophysics and Advanced Materials, Institute for Physical Sciences and Technology, University of Maryland, College Park, Maryland 20742, and Department of Physics, Stanford University, Stanford, California 94305

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

https://pubs.acs.org/doi/pdf/10.1021/nl0729375

Reference29 articles.

1. Nanoscale thermal transport

2. Near-Field Optics: Microscopy, Spectroscopy, and Surface Modification Beyond the Diffraction Limit

3. Thermal radiation scanning tunnelling microscopy

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