Application of Femtosecond Laser Ablation Time-of-Flight Mass Spectrometry to In-Depth Multilayer Analysis
Author:
Affiliation:
1. Institute for Spectrochemistry and Applied Spectroscopy, Bunsen-Kirchhoff Strasse 11, 44139 Dortmund, Germany
Publisher
American Chemical Society (ACS)
Subject
Analytical Chemistry
Link
https://pubs.acs.org/doi/pdf/10.1021/ac020791i
Reference31 articles.
1. Depth Profile Analysis of Multilayer Ni-Fe Alloy Coatings by Glow Discharge Optical Emission Spectroscopy (GDOES) and Energy Dispersive X-ray (EDX) Linescan—a Comparative Study
2. Bubert, H., Jenett, H., Eds;Surface and Thin Film Analysis; Wiley- VCH Verlag: Weinheim, 2002.
3. Can Laser-Ionisation Time-of-Flight Mass Spectrometry Be a Promising Alternative to Laser Ablation/Inductively-Coupled Plasma Mass Spectrometry and Glow Discharge Mass Spectrometry for the Elemental Analysis of Solids?
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