Single-Element Solution Comparisons with a High-Performance Inductively Coupled Plasma Optical Emission Spectrometric Method
Author:
Affiliation:
1. Chemical Science and Technology Laboratory, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, Maryland 20899-8391
Publisher
American Chemical Society (ACS)
Subject
Analytical Chemistry
Link
https://pubs.acs.org/doi/pdf/10.1021/ac0155097
Reference17 articles.
1. A Drift Correction Procedure
2. An ICP-OES Method with 0.2 Expanded Uncertainties for the Characterization of LiAlO2
3. http://kcdb.bipm.fr/BIPM-KCDB/AppendixB/specific_comparison3_4.asp.Aaccessed16 April 2001.
Cited by 57 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. A fit-for-purpose nongaseous impurity assay procedure for potential inorganic primary reference materials by inductively coupled plasma mass spectrometry;Accreditation and Quality Assurance;2024-09-02
2. Purity Determination of High-Purity BeO using Gravimetric Analysis with Stepwise Conversions of Weighing Form of Be;Talanta Open;2024-08
3. A Single Step Acid Assisted Microwave Digestion Method for the Complete Dissolution of Bauxite and Quantitation of its Composition (Al2O3, Fe2O3, SiO2, TiO2, Cr2O3, MgO, MnO and V2O5) by ICP‐AES;Geostandards and Geoanalytical Research;2023-04-13
4. Value assignment and uncertainty evaluation for anion and single-element reference solutions incorporating historical information;Analytical and Bioanalytical Chemistry;2023-02-27
5. Evaluation of two extraction chromatography resins for scandium and titanium separation for medical isotope production;Journal of Radioanalytical and Nuclear Chemistry;2023-02-13
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3