Optical Far-Field Method with Subwavelength Accuracy for the Determination of Nanostructure Dimensions in Large-Area Samples-Reference-Cited by-同舟云学术

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Optical Far-Field Method with Subwavelength Accuracy for the Determination of Nanostructure Dimensions in Large-Area Samples

Published:2013-05-02 Issue:6 Volume:13 Page:2662-2667
ISSN:1530-6984
Container-title:Nano Letters
language:en
Short-container-title:Nano Lett.

Author:

Anttu Nicklas¹,Heurlin Magnus¹,Borgström Magnus T.¹,Pistol Mats-Erik¹,Xu H. Q.¹²,Samuelson Lars¹

Affiliation:

1. Division of Solid State Physics and The Nanometer Structure Consortium (nmC@LU), Lund University, Box 118, S-22100 Lund, Sweden

2. Key Laboratory for the Physics and Chemistry of Nanodevices and Department of Electronics, Peking University, Beijing 100871, China

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

https://pubs.acs.org/doi/pdf/10.1021/nl400811q

Reference29 articles.

1. Large-Scale Hexagonal-Patterned Growth of Aligned ZnO Nanorods for Nano-optoelectronics and Nanosensor Arrays

2. Monolithic GaAs/InGaP nanowire light emitting diodes on silicon

3. Growth of Core–Shell InP Nanowires for Photovoltaic Application by Selective-Area Metal Organic Vapor Phase Epitaxy

4. Colorful InAs Nanowire Arrays: From Strong to Weak Absorption with Geometrical Tuning

5. Nanowires With Promise for Photovoltaics

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